多级感应线圈发射器测控系统设计

将电枢加速到较高速度，通常需要多级感应线圈连续加速；而提高多级感应线圈发射器的发射效率，则要求在电枢处于驱动线圈最佳触发位置时，电容器组同步放电。同时，需要采集发射过程中电枢的速度、电源的放电电压和放电电流等数据。因此，研制合理的测控系统是多级感应线圈发射器的关键。     

二轴晶外锥折射的理论分析

从晶体的简正模方程出发,求得在二轴晶体中,当光线沿第二类光轴（光线轴）方向行进时,所对应的电场矢量和电位移矢量,并通过几何证明,验证所有折射光线在晶体内均在同一锥面上。     

Determination of burn‐in parameters and residual life for highly reliable products

Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

改进的Euler方法应用于非线性方程求根

本文通过引入动力系统，将改进的Euler方法应用于非线性方程求根问题，给出非线性方程求根的预估-再校正迭代格式，证明了该格式至少二阶收敛并可以调节参数达到超收敛。最后给出数值实验，数值结果验证了算法的有效性。     

Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model

Instead of measuring a Wiener degradation or performance process at predetermined time points to track degradation or performance of a product for estimating its lifetime, we propose to obtain the first‐passage times of the process over certain nonfailure thresholds. Based on only these intermediate data, we obtain the uniformly minimum variance unbiased estimator and uniformly most accurate confidence interval for the mean lifetime. For estimating the lifetime distribution function, we propose a modified maximum likelihood estimator and a new estimator and prove that, by increasing the sample size of the intermediate data, these estimators and the above‐mentioned estimator of the mean lifetime can achieve the same levels of accuracy as the estimators assuming one has failure times. Thus, our method of using only intermediate data is useful for highly reliable products when their failure times are difficult to obtain. Furthermore, we show that the proposed new estimator of the lifetime distribution function is more accurate than the standard and modified maximum likelihood estimators. We also obtain approximate confidence intervals for the lifetime distribution function and its percentiles. Finally, we use light‐emitting diodes as an example to illustrate our method and demonstrate how to validate the Wiener assumption during the testing. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

二维超声速空气引射器启动特性试验研究

超声速引射器是高空模拟试车台的重要组件,在发动机启动前利用引射器对试验舱预抽真空,可避免发动机启动初始时刻燃气漏入试验舱造成燃气在发动机中分离,对获取发动机在高空环境下的完整推力特性具有重要意义。而该工况下超声速引射器的启动过程是引射器工作过程中最为恶劣的工况,设计不合理的引射器会导致启动压力过高甚至不能实现启动。建立了缩比超声速空气引射器试验台对超声速引射器的启动特性进行研究,采用压力测量方法结合纹影技术对超声速引射器处于极限启动压比时的流场进行了描述,研究结果表明混合室收缩比越小,引射器极限启动压比越低。同时给出了定位超声速引射器不启动原因的判据:当引射器不启动是由引射总压不足引起时,盲腔压力在引射总压提高时降低,并在临界启动状态下达到最小值;而由混合室收缩比过小导致的引射器不启动在引射总压提高时盲腔压力单调上升。     

透明栅控SOI薄膜横向PIN光电探测器的光电特性

透明栅控SOI薄膜横向PIN光电探测器,是一种以SOI技术和互补金属氯化物半导体工艺为基础,综合SOI器件和传统双极、场效应光敏器件的新型光电探测器。利用半导体器件物理和基本方程,介绍和分析了器件结构及其工作原理,建立电压、电流物理模型。应用SILVACO器件仿真软件,完成器件的数值模拟与验证。在中短波长工作段,器件光电流随栅极电压的增大而增大,表现出明显的栅压控制特性。全耗尽状态下,器件的内部量子效率在中短波长(400nm,450nm,530nm,600nm)的光辐射下,可达到96%以上,甚至接近100%。短波长下(280nm,350nm),量子效率最大值近80%。此外,器件的暗电流很低,光暗电流之比超过106,具有高灵敏度。     

某装备系统机电产品贮存可靠性评估方法

针对某装备系统机电产品长期自然贮存环境下可靠性无法准确评估的难题,提出了一种基于极小χ2估计和拟合优度检验的贮存可靠性评估方法,并对试验数据进行了分析、计算和处理。该方法通过拟合产品的失效分布来确定其分布函数参数,并根据确定的分布函数来预测产品的贮存可靠寿命。与现有的评估方法相比,采用该方法确定的分布函数更能反映产品的可靠性变化规律,对机电产品的贮存寿命预测结果更加合理,在工程研究领域具有很好的实用价值。     

某型导弹测试系统模块化设计

基于1553B及ARINC429总线的导弹系统已经广泛应用,为了在导弹研制及生产阶段检验导弹工作时序的正确性,需要一种测试设备对导弹的工作时序进行检测。阐述了该测试设备的构造及工作原理,硬件设计及软件设计。测试系统的研制成功满足了某型导弹的试验测试需求,也为后续相关型号测试设备的研制提供了基础。     

基于频谱的缺陷定位技术:逆向切片优于执行切片

一般情况下,缺陷定位技术的应用前提是必须存在测试预言,以判断测试用例的运行结果是失败或者成功,否则将无法使用。然而,在许多实际情况下,测试预言不存在或者很难定义,这就是著名的"预言家难题"。为了应对"预言家难题",利用蜕变测试,扩充了采用逆向切片基于频谱的缺陷定位技术的方法学,实现了其在无测试预言下的有效应用。基于上述研究,进一步对比了SFL技术中执行切片与逆向切片的缺陷定位能力。实验表明,在有测试预言和无测试预言两种情况下,逆向切片比执行切片具有更强的缺陷定位能力,并且公式GP19和ER1’相比于其他公式,更有可能达到最优结果。